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Beilstein J. Nanotechnol. 2014, 5, 1808–1814, doi:10.3762/bjnano.5.191
Figure 1: Schematics of mechanical tests performed on SiO2 NTs. Cantilever (half-suspended) beam bending insi...
Figure 2: HRSEM images of in situ bending of silica NT. Intact NT (a), slightly bend NT (b), significantly be...
Figure 3: Three-point bending test and nanoindentation. AFM image of suspended silica NT (a); force–distance ...
Figure 4: Fitting of three-point bending test of silica NT in AFM.
Figure 5: FEM simulation of a SiO2 NT nanoindentation. Perspective view (a), longitudinal cross section (b), ...
Beilstein J. Nanotechnol. 2014, 5, 133–140, doi:10.3762/bjnano.5.13
Figure 1: Schematics of the manipulation experiments inside an SEM. Solid arrow indicates the direction of th...
Figure 2: High resolution SEM images of Au NPs (150 nm) of different shape as deposited from a solution.
Figure 3: High resolution SEM images of Ag nanowires (diameter 120 nm) after pulsed laser annealing (a). Ag N...
Figure 4: Different models for the estimation of the contact area: facet area of a polyhedron for Au NPs (a),...
Figure 5: SEM snapshots of the manipulation process of a Au NP by using a tungsten tip, and the corresponding...
Figure 6: Snapshots of the manipulation of a Ag NP by using an AFM tip, and the corresponding force curve. Th...
Figure 7: Distribution histogram of static friction force values that were experimentally measured for NPs of...
Figure 8: High resolution SEM images of Ag NPs (no force recording during the displacement of the NPs). Trace...
Figure 9: The static friction force of Ag NPs on a Si wafer as a function of the radius of the NPs. The stati...